1.Development of Fault Detection Systems Based on Big Data Ecosystem in Semiconductor Manufacturing: The Hadoop Ecosystem Implementation
Fu, Hui Chu, Qiao, Y
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Fu, Hui Chu, Qiao, Yan, Bai, Li Ping, Wu, Nai Qi, Liu, Bin, He, Yun Fang
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IEEE Robotics and Automation Magazine[1070-9932],
Published 2023,
Volume 30,
Issue 2,
Pages 22-33
收錄情况:
WOS
SCOPUS
WOS核心合集引用: 1
2023影響因子:
6.1
发表年影響因子:
6.1