1.AFM and Raman studies of topological insulator materials subject to argon plasma etching
Childres, I, Tian, J More...
PHILOSOPHICAL MAGAZINE[1478-6435], Published 2013, Volume 93, Issue 6, Pages 681-689
收錄情况: WOS SCOPUS
WOS核心合集引用: 22 2023影響因子: 1.5 发表年影響因子: 1.427
2.Ultrafast Surface Carrier Dynamics in the Topological Insulator Bi2Te3
Hajlaoui, M, Papalaz More...
NANO LETTERS[1530-6984], Published 2012, Volume 12, Issue 7, Pages 3532-3536
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WOS核心合集引用: 207 2023影響因子: 9.6 发表年影響因子: 13.025
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