1.Effort-Aware Just-in-Time Bug Prediction for Mobile Apps Via Cross-Triplet Deep Feature Embedding

Xu, Zhou, Zhao, Kuns     More...

Xu, Zhou, Zhao, Kunsong, Zhang, Tao, Fu, Chunlei, Yan, Meng, Xie, Zhiwen, Zhang, Xiaohong, Catolino, Gemma     Less

IEEE Transactions on Reliability[0018-9529], Published 2021, Volume 71, Issue 1, Pages 204-220

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2023影響因子:  5.0  发表年影響因子:  5.883 

2.Effective Prediction of Bug-Fixing Priority via Weighted Graph Convolutional Networks

Fang, S, Tan, YS, Zh     More...

Fang, S, Tan, YS, Zhang, T, Xu, Z, Liu, H     Less

IEEE TRANSACTIONS ON RELIABILITY[0018-9529], Published 2021, Volume 70, Issue 2, Pages 563-574

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WOS核心合集引用: 25  2023影響因子:  5.0  发表年影響因子:  5.883 

3.Simplified Deep Forest Model Based Just-in-Time Defect Prediction for Android Mobile Apps

Zhao, KS, Xu, Z, Zha     More...

Zhao, KS, Xu, Z, Zhang, T, Tang, YT, Yan, M     Less

IEEE TRANSACTIONS ON RELIABILITY[0018-9529], Published 2021, Volume 70, Issue 2, Pages 848-859

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WOS核心合集引用: 28  2023影響因子:  5.0  发表年影響因子:  5.883 

4.Feature-FL: Feature-Based Fault Localization

Lei, Y, Xie, H, Zhan     More...

Lei, Y, Xie, H, Zhang, T, Yan, M, Xu, Z, Sun, CN     Less

IEEE TRANSACTIONS ON RELIABILITY[0018-9529], Published 2022, Volume 71, Issue 1, Pages 264-283

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WOS核心合集引用: 18  2023影響因子:  5.0  发表年影響因子:  5.9 

5.Java Code Clone Detection by Exploiting Semantic and Syntax Information From Intermediate Code-Based Graph

Yuan, Dawei, Fang, S     More...

Yuan, Dawei, Fang, Sen, Zhang, Tao, Xu, Zhou, Luo, Xiapu     Less

IEEE Transactions on Reliability[0018-9529], Published 2022, Volume 72, Issue 2, Pages 511-526

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WOS核心合集引用: 11  2023影響因子:  5.0  发表年影響因子:  5.9 

6.Effective Prediction of Bug-Fixing Priority via Weighted Graph Convolutional Networks (vol 70, pg 563, 2021)

Fang, S, Tan, YS, Zh     More...

Fang, S, Tan, YS, Zhang, T, Xu, Z, Liu, H     Less

IEEE TRANSACTIONS ON RELIABILITY[0018-9529], Published 2024, Volume 73, Issue 4, Pages 1994-1994

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WOS核心合集引用: 0  2023影響因子:  5.0 

7.UNA: Improving Automated PL-NL System by A Unified Neural Architecture

Yuan, Dawei, Zhang,     More...

Yuan, Dawei, Zhang, Tao, Jiang, He     Less

IEEE Transactions on Reliability[0018-9529], Published 2025,

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2023影響因子:  5.0