1.Slice analysis-based Bayesian inference dynamic power model for CMOS combinational circuits= 基于切片分析的CMOS组合电路贝叶斯动态功耗模型
Chen, Jie, Tong, Don
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Chen, Jie, Tong, Dong, Li, Xianfeng, Xie, Jinsong, Cheng, Xu
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Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors[0253-4177],
Published 2008,
Volume 29,
Issue 3,
Pages 502-509
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CNKI