1.Extended Abstract of Candidate Test Set Reduction for Adaptive Random Testing: An Overheads Reduction Technique
Huang, RB, Chen, HB,
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Huang, RB, Chen, HB, Sun, WF, Towey, D
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2023 IEEE INTERNATIONAL CONFERENCE ON SOFTWARE ANALYSIS, EVOLUTION AND REENGINEERING, SANER[1534-5351],
Published 2023,
Pages 853-854
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