1.Damage study of ITO under high electric field

He, J, Lu, M, Zhou,     More...

He, J, Lu, M, Zhou, X, Cao, JR, Wang, KL, Liao, LS, Deng, ZB, Ding, XM, Hou, XY, Lee, ST     Less

THIN SOLID FILMS[0040-6090], Published 2000, Volume 363, Issue 1-2, Pages 240-243

收錄情况： WOS SCOPUS

WOS核心合集引用: 24  2023影響因子:  2.0  发表年影響因子:  1.160 

2.Effects of O, H and N passivation on photoluminescence from porous silicon

Xiong, ZH, Liao, LS,     More...

Xiong, ZH, Liao, LS, Yuan, S, Yang, ZR, Ding, XM, Hou, XY     Less

THIN SOLID FILMS[0040-6090], Published 2001, Volume 388, Issue 1-2, Pages 271-276

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WOS核心合集引用: 26  2023影響因子:  2.0  发表年影響因子:  1.266 

3.Strong surface segregation of Sb atoms at low temperatures during Si molecular beam epitaxy

Jiang, ZM, Pei, CW,     More...

Jiang, ZM, Pei, CW, Liao, LS, Zhou, XF, Zhang, XJ, Wang, X, Jia, QJ, Jiang, XM, Ma, ZH, Smith, TR, Sou, IK     Less

THIN SOLID FILMS[0040-6090], Published 1998, Volume 336, Issue 1-2, Pages 236-239

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WOS核心合集引用: 12  2023影響因子:  2.0  发表年影響因子:  1.019 

4.Electronic structure and energy level alignment of Alq(3)/Al2O3/Al and Alq(3)/Al interfaces studied by ultraviolet photoemission spectroscopy

Wang, KL, Lai, B, Lu     More...

Wang, KL, Lai, B, Lu, M, Zhou, X, Liao, LS, Ding, XM, Hou, XY, Lee, ST     Less

THIN SOLID FILMS[0040-6090], Published 2000, Volume 363, Issue 1-2, Pages 178-181

收錄情况： WOS SCOPUS

WOS核心合集引用: 42  2023影響因子:  2.0  发表年影響因子:  1.160