1.Improved device reliability in organic light emitting devices by controlling the etching of indium zinc oxide anode
Liao, YJ, Lou, YH, W
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Liao, YJ, Lou, YH, Wang, ZK, Liao, LS
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CHINESE PHYSICS B[1674-1056],
Published 2014,
Volume 23,
Issue 11,
Pages 638-642
收錄情况:
WOS
SCOPUS
CNKI
WOS核心合集引用: 4
2023影響因子:
1.5
发表年影響因子:
1.603