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    1.Effects of O, H and N passivation on photoluminescence from porous silicon

    Xiong, ZH, Liao, LS,     More...

    THIN SOLID FILMS[0040-6090], Published 2001, Volume 388, Issue 1-2, Pages 271-276

    收錄情况: WOS SCOPUS

    WOS核心合集引用: 25  2022影響因子:  2.1  发表年影響因子:  1.266 

    2.Damage study of ITO under high electric field

    He, J, Lu, M, Zhou,     More...

    THIN SOLID FILMS[0040-6090], Published 2000, Volume 363, Issue 1-2, Pages 240-243

    收錄情况: WOS SCOPUS

    WOS核心合集引用: 23  2022影響因子:  2.1  发表年影響因子:  1.160 

    3.Electronic structure and energy level alignment of Alq(3)/Al2O3/Al and Alq(3)/Al interfaces studied by ultraviolet photoemission spectroscopy

    Wang, KL, Lai, B, Lu     More...

    THIN SOLID FILMS[0040-6090], Published 2000, Volume 363, Issue 1-2, Pages 178-181

    收錄情况: WOS SCOPUS

    WOS核心合集引用: 42  2022影響因子:  2.1  发表年影響因子:  1.160 

    4.Strong surface segregation of Sb atoms at low temperatures during Si molecular beam epitaxy

    Jiang, ZM, Pei, CW,     More...

    THIN SOLID FILMS[0040-6090], Published 1998, Volume 336, Issue 1-2, Pages 236-239

    收錄情况: WOS SCOPUS

    WOS核心合集引用: 12  2022影響因子:  2.1  发表年影響因子:  1.019 

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