1.Unification of Closed-Open Industrial Detection Scenarios: New Large-Scale Benchmarks, Challenges and Baselines
Zhang, Zekai, Zhang,
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Zhang, Zekai, Zhang, Jinglin, Chen, Qinghui, Li, Gang, Chen, Da, Jing, Shuainan, Wang, He, Li, Dagang, Liu, Cong, Bai, Cong, Chen, Shengyong
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IEEE Transactions on Pattern Analysis and Machine Intelligence[0162-8828],
Published 2026,
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2024影響因子:
18.6
