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    1.Segment Anything in Industrial defect detection

    Deng, Fuqin, Xu, Zhi     More...

    IEEE International Conference on Industrial Informatics (INDIN)[1935-4576], Published 2025,

    收錄情况: SCOPUS

    2.Fabric-DETR: An Efficient Transformer Network for Multi-Scale Fabric Defect Detection in Complex Environments

    Deng, Fuqin, Xia, Qi     More...

    IEEE International Conference on Industrial Informatics (INDIN)[1935-4576], Published 2025,

    收錄情况: SCOPUS

    3.SAE-Diffu: A Controllable Data Enhancement Method for Semiconductor Chip Defect Images

    Deng, Fuqin, Dong, Q     More...

    IEEE International Conference on Industrial Informatics (INDIN)[1935-4576], Published 2025,

    收錄情况: SCOPUS

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