1.Segment Anything in Industrial defect detection
Deng, Fuqin, Xu, Zhi More...
IEEE International Conference on Industrial Informatics (INDIN)[1935-4576], Published 2025,
收錄情况: SCOPUS
Deng, Fuqin, Xia, Qi More...
IEEE International Conference on Industrial Informatics (INDIN)[1935-4576], Published 2025,
收錄情况: SCOPUS
3.SAE-Diffu: A Controllable Data Enhancement Method for Semiconductor Chip Defect Images
Deng, Fuqin, Dong, Q More...
IEEE International Conference on Industrial Informatics (INDIN)[1935-4576], Published 2025,
收錄情况: SCOPUS
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